Przegląd Elektrotechniczny
tttt/div>

Oldest magazine of Polish electrician. It appears since 1919.

strona w języku polskim english page



No/VOL: 09/2022 Page no. 103

Authors: Damian Bisewski :

Title: Application of the genetic algorithm in the estimation process of models parameters of semiconductor devices

Abstract: The paper concerns the application of the genetic algorithm in the process of parameter estimation of an arbitrarily selected MOSFET model. The structure and the principle of operation of the genetic algorithm have been presented. The influence of selected parameters controlling the algorithm operation on the calculated values of the objective function has been shown. A modification of the crossing operator providing calculation results of greater accuracy has been proposed.

Key words: genetic algorithm, optimalization, modelling, MOSFET

back